ANSTO Publications Online >
Journal Publications >
Journal Articles >

Please use this identifier to cite or link to this item: http://apo.ansto.gov.au/dspace/handle/10238/2321

Title: Transient conductance technique for characterisation of deep-level defects in highly irradiated detector-grade silicon.
Authors: Alexiev, D
Reinhard, MI
Mo, L
Rosenfeld, A
Keywords: Silicon
Deep Level Transient Spectroscopy
Defects
Irradiation
Capacitance
Oscillators
Issue Date: 11-Sep-1999
Publisher: Elsevier
Citation: Alexiev, D., Reinhard, M. I., Mo, L., & Rosenfeld, A. (1999). Transient conductance technique for characterisation of deep-level defects in highly irradiated detector-grade silicon. Nuclear Instruments & Methods in Physics Research Section a-Accelerators, Spectrometers, Detectors and Associated Equipment, 434(1), 103-113.
Abstract: The use of conventional capacitance-based deep-level transient spectroscopy is not applicable when defect concentrations approach the background carrier concentration. Due to this limitation the technique cannot be used for examining heavily irradiated silicon, or semi-insulating semiconductor materials. Optical deep-level transient conductance spectroscopy can overcome the limitations of capacitance-based techniques through the measurement of a conductance transient measured with a marginal oscillator. This paper provides details of the application of this method to heavily damaged high-purity silicon. Silicon-based PIN detector structures irradiated with 1 MeV neutrons, to approximately 3×1013 n/cm2 and detectors irradiated with 24 GeV/c protons, to 3.8×1013 p/cm2, were examined. © 1999, Elsevier Ltd.
URI: http://dx.doi.org/10.1016/S0168-9002(99)00441-6
http://apo.ansto.gov.au/dspace/handle/10238/2321
ISSN: 0168-9002
Appears in Collections:Journal Articles

Files in This Item:

There are no files associated with this item.

Items in APO are protected by copyright, with all rights reserved, unless otherwise indicated.

 

Valid XHTML 1.0! DSpace Software Copyright © 2002-2010  Duraspace - Feedback