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|Title: ||Study of oxygen incorporation in PLD MgB2 films by Rutherford backscattering spectroscopy.|
|Authors: ||Zhao, Y|
|Keywords: ||Thin Films|
Rutherford Backscattering Spectroscopy
|Issue Date: ||Jun-2007|
|Publisher: ||Institute of Electrical and Electronics Engineers (IEEE)|
|Citation: ||Zhao, Y., Ionescu, M., Dou, S. X., & Liu, H. K. (2007). Study of oxygen incorporation in PLD MgB2 films by Rutherford backscattering spectroscopy. IEEE Transactions on Applied Superconductivity, 17(2), 2875-2878.|
|Abstract: ||The Rutherford backscattering (RBS) method has been employed to study the incorporation of oxygen into MgB2 films during their fabrication by pulsed-laser deposition (PLD). A series of MgB2 thin film samples were analyzed, including two films produced in situ on Al2O3 - c substrates (with higher T-c and lower T-c) with an on-axis geometry, one film produced in situ with an off-axis geometry, and one film produced ex situ, with a bulk-like T-c. The amount of oxygen detected by RBS, which is stable in the form of MgO, appears to be correlated with the T-c of the films, the higher the T-c the lower the oxygen content. The superconducting properties of the thin films are discussed in the context of the RBS results. © 2007, Institute of Electrical and Electronics Engineers (IEEE)|
|Appears in Collections:||Journal Articles|
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