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|Title: ||Heavy ion ToF analysis of oxygen incorporation in MgB2 thin films.|
|Authors: ||Ionescu, M|
|Keywords: ||Thin Films|
|Issue Date: ||Apr-2008|
|Citation: ||Ionescu, M., Zhao, Y., Siegele, R., Cohen, D. D., Stelcer, E., & Prior, M. (2008). Heavy ion ToF analysis of oxygen incorporation in MgB2 thin films. Nuclear Instruments & Methods in Physics Research Section b-Beam Interactions with Materials and Atoms, 266(8), 1701-1704.|
|Abstract: ||Oxygen incorporation in MgB2 thin films during their fabrication process has a strong influence on the future properties of the films, and was studied by Elastic Recoil Detection Analysis with heavy ions and a time-of-flight detection. A series of MgB2 thin film samples were analyzed, including films produced in situ on Al2O3-C and Si (0 0 1) substrates (with higher Tc and lower Tc) with an “on-axis” geometry, and films produced in situ with an “off-axis” geometry. The amount of oxygen detected in these films appears to be correlated with the Tc of the films, the higher the Tc the lower the oxygen content. The superconducting properties of the examined thin films are discussed in the context of the ERDA results. © 2008, Elsevier Ltd.|
|Appears in Collections:||Journal Articles|
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