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Title: Diffuse reflectance and x-ray photoelectron spectroscopy of uranium in ZrO2 and Y2Ti2O7.
Authors: Vance, ER
Zhang, Y
Zhang, ZM
Keywords: X-Ray Photoelectron Spectroscopy
Issue Date: 1-May-2010
Publisher: Elsevier
Citation: Vance, E. R., Zhang, Y., & Zhang, Z. M. (2010). Diffuse reflectance and x-ray photoelectron spectroscopy of uranium in ZrO2 and Y2Ti2O7. Journal of Nuclear Materials, 400(1), 8-14.
Abstract: Diffuse reflectance measurements were made over the wavenumber range of 4000–20,000 cm−1 at room temperature on monoclinic and stabilised ZrO2, together with Y2Ti2O7 having the pyrochlore structure, all of which were doped with U and sintered in various atmospheres. X-ray photoelectron spectroscopy measurements were also carried out on selected samples. In monoclinic and stabilised zirconia, U exhibited valence states of +4 and/or +5, depending on the sintering atmosphere and the presence of appropriate charge compensators. Using both diffuse reflectance and X-ray photoelectron spectroscopy, U was also observed as mainly U4+ and/or U5+ in U-doped Y2Ti2O7 sintered at 1400°C in air or Ar, although a small amount of U6+ also appeared to be present in some U-doped Y2Ti2O7 samples heated in air. © 2010, Elsevier Ltd.
ISSN: 0022-3115
Appears in Collections:Journal Articles

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