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|Title: ||Adsorption at liquid interfaces: a comparison of multiple experimental techniques.|
|Authors: ||Law, BM|
|Issue Date: ||Feb-2009|
|Publisher: ||EDP Sciences|
|Citation: ||Law, B. M., Brown, M. D., Marchand, L., Lurio, L. B., Hamilton, W. A., Kuzmenko, I., et al. (2009). Adsorption at liquid interfaces: a comparison of multiple experimental techniques. European Physical Journal-Special Topics, 167, 127-132.|
|Abstract: ||It has proven to be a challenging task to quantitatively resolve the interfacial pro. le at diffuse interfaces, such as, the adsorption pro. le near a bulk binary liquid mixture critical point. In this contribution we examine the advantages and disadvantages of a variety of experimental techniques for studying adsorption, including neutron reflectometry, X-ray reflectometry and ellipsometry. Short length scale interfacial features are best resolved using neutron/X-ray reflectometry, whereas, large length scale interfacial features are best resolved using ellipsometry, or in special circumstances, neutron reflectometry. The use of multiple techniques severely limits the shape of the adsorption pro. le that can describe all experimental data sets. Complex interfaces possessing surface features on many different length scales are therefore best studied using a combination of neutron/X-ray reflectometry and ellipsometry. © 2009, EDP Sciences|
|Appears in Collections:||Journal Articles|
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