Statistics for Charge collection efficiency degradation induced by MeV ions in semiconductor devices: model and experiment
Total visits
views | |
---|---|
Charge collection efficiency degradation induced by MeV ions in semiconductor devices: model and experiment | 570 |
Total visits per month
views | |
---|---|
June 2024 | 0 |
July 2024 | 0 |
August 2024 | 0 |
September 2024 | 0 |
October 2024 | 0 |
November 2024 | 0 |
December 2024 | 1 |
Top country views
views | |
---|---|
United States | 240 |
China | 140 |
Australia | 128 |
Germany | 40 |
France | 27 |
United Kingdom | 24 |
Ireland | 14 |
Poland | 11 |
Russia | 11 |
Singapore | 10 |
Ukraine | 6 |
Finland | 4 |
Sweden | 3 |
Japan | 2 |
Canada | 1 |
South Korea | 1 |
Top city views
views | |
---|---|
Sunnyvale | 37 |
Ashburn | 28 |
Kiez | 25 |
Alexandria | 24 |
Indianapolis | 21 |
Dublin | 14 |
Kraków | 11 |
Singapore | 10 |
Gunzenhausen | 9 |
Moscow | 9 |
Romeo | 9 |
West Palm Beach | 6 |
Seattle | 4 |
Beijing | 3 |
Kirrawee | 3 |
Overland Park | 2 |
Saint Petersburg | 2 |
Boardman | 1 |
Des Moines | 1 |
Helsinki | 1 |
Lund | 1 |
Mountain View | 1 |
Port Hope | 1 |
San Francisco | 1 |
Shenzhen | 1 |