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| Issue Date | Title | Author(s) |
|---|---|---|
| 1-Nov-2016 | Probing long- and short-range disorder in Y2Ti2–xHfxO7 by diffraction and spectroscopy techniques | Zhang, Z; Avdeev, M; de los Reyes, M; Lumpkin, GR; Kennedy, BJ; Blanchard, PER; Liu, S; Tadich, A; Cowie, BCC |