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Issue Date	Title	Author(s)
Nov-2007	ANSTO heavy ion ToF for analysis of light elements in thin films	Ionescu, M; Zhao, Y; Siegele, R; Cohen, DD; Lynch, D; Garton, D; Stelcer, E; Prior, MJ
15-Sep-2012	Accelerator based ion beam analysis techniques contribute to a better understanding of long range fine particle pollution in Asia	Cohen, DD; Stelcer, E; Crawford, J; Bac, VT
17-May-2010	Development of accelerator based micro IBA techniques for the study of environmental samples and material characterisation.	Cohen, DD; Siegele, R; Stelcer, E; Ionescu, M; Garton, D