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Results 1-10 of 22 (Search time: 0.002 seconds).
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Issue DateTitleAuthor(s)
1-Aug-2017The new confocal heavy ion microprobe beamline at ANSTO: the first microprobe resolution tests and applications for elemental imaging and analysisPastuovic, Z; Siegele, R; Cohen, DD; Mann, M; Ionescu, M; Button, D; Long, S
16-Sep-2013Influence of different mass absorption coefficient datasets on PIXE yieldsSiegele, R; Cohen, DD
1-Jan-2010Doping of ZnO thin film with Eu using ion beamsIonescu, M; Photongkam, P; Yu, DH; Siegele, R; Li, S; Cohen, DD
15-Mar-2016SIRIUS - a new 6MV accelerator system for IBA and AMS at ANSTOPastuovic, Z; Button, D; Cohen, DD; Fink, D; Garton, D; Hotchkis, MAC; Ionescu, M; Long, S; Levchenko, VA; Mann, M; Siegele, R; Smith, AM; Wilcken, KM
Nov-2008X-ray absorption spectroscopy at the Ni-K edge in stackhousia tryonii bailey hyperaccumulatorLonescu, M; Bhatia, NP; Cohen, DD; Kachenko, AG; Siegele, R; Marcus, MA; Fakra, S; Foran, GJ
15-Feb-2012Enhanced biocompatibility of PDMS (polydimethylsiloxane) polymer films by ion irradiationIonescu, M; Winton, BR; Wexler, D; Siegele, R; Deslantes, A; Stelcer, E; Atanacio, AJ; Cohen, DD
1-Jan-2012Fabrication and characterisation of diluted magnetic semiconductors thin films using ion beamsIonescu, M; Photongkam, P; Siegele, R; Deslandes, A; Li, S; Cohen, DD
15-Jul-2013Oxidation of polyethylene implanted with low energy magnesium ionsDeslandes, A; Ionescu, M; Karatchevtseva, I; Siegele, R; Cohen, DD
Mar-2008Silicon detector dead layer thickness estimates using proton bremsstrahlung from low atomic number targetsCohen, DD; Stelcer, E; Siegele, R; Ionescu, M
Apr-2008Heavy ion ToF analysis of oxygen incorporation in MgB2 thin filmsIonescu, M; Zhao, Y; Siegele, R; Cohen, DD; Stelcer, E; Prior, MJ