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Results 1-10 of 15 (Search time: 0.005 seconds).
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Issue Date
Title
Author(s)
Mar-2008
Localisation of trace metals in metal-accumulating plants using μ-PIXE
Siegele, R
;
Kachenko, AG
;
Bhatia, NP
;
Wang, YD
;
Ionescu, M
;
Singh, B
;
Baker, AJM
;
Cohen, DD
15-Mar-2016
SIRIUS - a new 6MV accelerator system for IBA and AMS at ANSTO
Pastuovic, Z
;
Button, D
;
Cohen, DD
;
Fink, D
;
Garton, D
;
Hotchkis, MAC
;
Ionescu, M
;
Long, S
;
Levchenko, VA
;
Mann, M
;
Siegele, R
;
Smith, AM
;
Wilcken, KM
1-Jan-2012
Fabrication and characterisation of diluted magnetic semiconductors thin films using ion beams
Ionescu, M
;
Photongkam, P
;
Siegele, R
;
Deslandes, A
;
Li, S
;
Cohen, DD
Jul-2007
Characterisation of a ΔE–E particle telescope using the ANSTO heavy ion microprobe
Siegele, R
;
Reinhard, MI
;
Prokopovich, DA
;
Ionescu, M
;
Cohen, DD
;
Rosenfeld, AB
;
Cornelius, IM
;
Wroe, A
;
Lerch, MLF
;
Fazzi, A
;
Pola, A
;
Agosteo, S
15-Jul-2013
Oxidation of polyethylene implanted with low energy magnesium ions
Deslandes, A
;
Ionescu, M
;
Karatchevtseva, I
;
Siegele, R
;
Cohen, DD
1-Dec-2013
Initial damage processes for diamond film exposure to hydrogen plasma
Deslandes, A
;
Guenette, MC
;
Samuell, CM
;
Karatchevtseva, I
;
Ionescu, M
;
Cohen, DD
;
Blackwell, B
;
Corr, CS
;
Riley, DP
15-Jun-2009
Improved resolution and sensitivity on the ANSTO microprobe and it's application to μ-PIXE
Siegele, R
;
Kachenko, AG
;
Ionescu, M
;
Cohen, DD
Apr-2008
Experimental bremsstrahlung yields for MeV proton bombardment of beryllium and carbon
Cohen, DD
;
Stelcer, E
;
Siegele, R
;
Ionescu, M
;
Prior, MJ
1-Nov-2013
Formation of energetic heavy ion tracks in polyimide thin films
Deslandes, A
;
Murugaraj, P
;
Mainwaring, DE
;
Ionescu, M
;
Cohen, DD
;
Siegele, R
Mar-2008
Silicon detector dead layer thickness estimates using proton bremsstrahlung from low atomic number targets
Cohen, DD
;
Stelcer, E
;
Siegele, R
;
Ionescu, M
Discover
Author
2
Long, S
2
Mann, M
2
Pastuovic, Z
2
Photongkam, P
2
Prior, MJ
1
Agosteo, S
1
Atanacio, AJ
1
Baker, AJM
1
Bhatia, NP
1
Blackwell, B
.
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Subject
4
ANSTO
4
PIXE analysis
4
Thin films
2
Bremsstrahlung
2
Carbon
2
Energy
2
Heavy ions
2
Hydrogen
2
Ion beams
2
Ion microprobe analysis
.
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