1. ANSTO Publications Online

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Results 1-10 of 22 (Search time: 0.001 seconds).
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Issue DateTitleAuthor(s)
1-Jan-2012Fabrication and characterisation of diluted magnetic semiconductors thin films using ion beamsIonescu, M; Photongkam, P; Siegele, R; Deslandes, A; Li, S; Cohen, DD
15-Jul-2013Oxidation of polyethylene implanted with low energy magnesium ionsDeslandes, A; Ionescu, M; Karatchevtseva, I; Siegele, R; Cohen, DD
Jul-2007Characterisation of a ΔE–E particle telescope using the ANSTO heavy ion microprobeSiegele, R; Reinhard, MI; Prokopovich, DA; Ionescu, M; Cohen, DD; Rosenfeld, AB; Cornelius, IM; Wroe, A; Lerch, MLF; Fazzi, A; Pola, A; Agosteo, S
Mar-2008Silicon detector dead layer thickness estimates using proton bremsstrahlung from low atomic number targetsCohen, DD; Stelcer, E; Siegele, R; Ionescu, M
Apr-2008Heavy ion ToF analysis of oxygen incorporation in MgB2 thin films.Ionescu, M; Zhao, Y; Siegele, R; Cohen, DD; Stelcer, E; Prior, MJ
21-Jul-2011Chemical alterations to murine brain tissue induced by formation fixation: implications for biospectroscopic imaging and mapping studies of disease pathogenesisHackett, MJ; McQuillan, JA; El-Assaad, F; Aitken, JB; Levina, A; Cohen, DD; Siegele, R; Carter, EA; Grau, GE; Hunt, NH; Lay, PA
15-Oct-2011Investigation of the mouse cerebellum using STIM and mu-PIXE spectrometric and FTIR spectroscopic mapping and imagingHackett, MJ; Siegele, R; El-Assaad, F; McQuillan, JA; Aitken, JB; Carter, EA; Grau, GE; Hunt, NH; Cohen, DD; Lay, PA
1-Aug-2014Generation of vacancy cluster-related defects during single MeV silicon ion implantation of siliconPastuovic, Z; Capan, I; Siegele, R; Jacimovic, R; Forneris, J; Cohen, DD; Vittone, E
15-Nov-2015K, L, and M shell datasets for PIXE spectrum fitting and analysisCohen, DD; Crawford, J; Siegele, R
1-Nov-2013Formation of energetic heavy ion tracks in polyimide thin filmsDeslandes, A; Murugaraj, P; Mainwaring, DE; Ionescu, M; Cohen, DD; Siegele, R

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