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Issue DateTitleAuthor(s)
7-Jul-2014Radiation hardness of n-type SiC Schottky diodesPastuovic, Z; Vittone, E; Siegele, RN; Ohshima, T; Iwamoto, N; Forneris, J; Cohen, DD; Capan, I
1-Aug-2014Generation of vacancy cluster-related defects during single MeV silicon ion implantation of siliconPastuovic, Z; Capan, I; Siegele, R; Jacimovic, R; Forneris, J; Cohen, DD; Vittone, E
13-May-2013Developing electronic devices capable of withstanding harsh radiationPastuovic, Z; Vittone, E; Siegele, R; Capan, I; Vizkelethy, G; Cohen, DD; Jakšić, M
15-Mar-2016SIRIUS - a new 6MV accelerator system for IBA and AMS at ANSTOPastuovic, Z; Button, D; Cohen, DD; Fink, D; Garton, D; Hotchkis, MAC; Ionescu, M; Long, S; Levchenko, VA; Mann, M; Siegele, R; Smith, AM; Wilcken, KM
1-Jul-2013Light and heavy ion beam analysis of thin biological sectionsLee, J; Siegele, R; Pastuovic, Z; Hackett, MJ; Hunt, NH; Grau, GE; Cohen, DD; Lay, PA
1-Apr-2015Radiation hardness of n-type SiC Schottky barrier diodes irradiated with MeV He ion microbeamPastuovic, Z; Capan, I; Cohen, DD; Forneris, J; Iwamoto, N; Ohshima, T; Siegele, RN; Hoshino, N; Tsuchida, H
1-Aug-2017The new confocal heavy ion microprobe beamline at ANSTO: the first microprobe resolution tests and applications for elemental imaging and analysisPastuovic, Z; Siegele, R; Cohen, DD; Mann, M; Ionescu, M; Button, D; Long, S

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