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Item hits:
Issue DateTitleAuthor(s)
7-Jul-2014Radiation hardness of n-type SiC Schottky diodesPastuovic, Z; Vittone, E; Siegele, RN; Ohshima, T; Iwamoto, N; Forneris, J; Cohen, DD; Capan, I
13-May-2013Developing electronic devices capable of withstanding harsh radiationPastuovic, Z; Vittone, E; Siegele, R; Capan, I; Vizkelethy, G; Cohen, DD; Jakšić, M
1-Aug-2014Generation of vacancy cluster-related defects during single MeV silicon ion implantation of siliconPastuovic, Z; Capan, I; Siegele, R; Jacimovic, R; Forneris, J; Cohen, DD; Vittone, E

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