Search


Current filters:

Start a new search
Add filters:

Use filters to refine the search results.


Results 11-20 of 21 (Search time: 0.006 seconds).
Item hits:
Issue DateTitleAuthor(s)
15-Jul-2013Oxidation of polyethylene implanted with low energy magnesium ionsDeslandes, A; Ionescu, M; Karatchevtseva, I; Siegele, R; Cohen, DD
15-Feb-2012Enhanced biocompatibility of PDMS (polydimethylsiloxane) polymer films by ion irradiationIonescu, M; Winton, BR; Wexler, D; Siegele, R; Deslantes, A; Stelcer, E; Atanacio, AJ; Cohen, DD
Mar-2008Silicon detector dead layer thickness estimates using proton bremsstrahlung from low atomic number targetsCohen, DD; Stelcer, E; Siegele, R; Ionescu, M
Apr-2008Heavy ion ToF analysis of oxygen incorporation in MgB2 thin films.Ionescu, M; Zhao, Y; Siegele, R; Cohen, DD; Stelcer, E; Prior, MJ
Jul-2007Characterisation of a ΔE–E particle telescope using the ANSTO heavy ion microprobeSiegele, R; Reinhard, MI; Prokopovich, DA; Ionescu, M; Cohen, DD; Rosenfeld, AB; Cornelius, IM; Wroe, A; Lerch, MLF; Fazzi, A; Pola, A; Agosteo, S
1-Jan-2012Fabrication and characterisation of diluted magnetic semiconductors thin films using ion beamsIonescu, M; Photongkam, P; Siegele, R; Deslandes, A; Li, S; Cohen, DD
14-Jan-2014The Centre for Accelerator Science at ANSTOHotchkis, MAC; Child, DP; Cohen, DD; Dodson, JR; Fink, D; Fujioka, T; Garton, D; Hua, Q; Ionescu, M; Jacobsen, GE; Levchenko, VA; Misfud, C; Pastuovic,Z; Siegele, R; Smith, AM; Wilcken, KM; Williams, AG
15-Mar-2016SIRIUS - a new 6MV accelerator system for IBA and AMS at ANSTOPastuovic, Z; Button, D; Cohen, DD; Fink, D; Garton, D; Hotchkis, MAC; Ionescu, M; Long, S; Levchenko, VA; Mann, M; Siegele, R; Smith, AM; Wilcken, KM
1-Aug-2017The new confocal heavy ion microprobe beamline at ANSTO: the first microprobe resolution tests and applications for elemental imaging and analysisPastuovic, Z; Siegele, R; Cohen, DD; Mann, M; Ionescu, M; Button, D; Long, S
17-May-2010Development of accelerator based micro IBA techniques for the study of environmental samples and material characterisation.Cohen, DD; Siegele, R; Stelcer, E; Ionescu, M; Garton, D