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Title: Characterisation and application of a SPLEED-based spin polarisation analyser.
Authors: Yu, DH
Math, C
Meier, M
Escher, M
Rangelov, G
Donath, M
Keywords: Electron Spin Resonance
Electron Diffraction
Issue Date: 15-Dec-2007
Publisher: Elsevier
Citation: Yu, D. H., Math, C., Meier, M., Escher, M., Rangelov, G., & Donath, M. (2007). Characterisation and application of a SPLEED-based spin polarisation analyser. Surface Science, 601, 5803-5808. doi:10.1016/j.susc.2007.06.061
Abstract: A commercial electron spin analyser, based on spin-polarised low-energy electron diffraction (SPLEED) from W(100), has been characterised with incident polarised electron beams from a standard GaAs polarised electron source. The dependence of the Sherman function on the scattering energy and elapse time after CO-flash of the tungsten crystal of the analyser have been measured. The influence of the stray magnetic field on the performance of the analyser has been investigated. The spin analyser has been applied in monitoring the reorientation transition of the easy magnetisation direction of Fe films on W(110) upon the exposure of CO adsorbent on the surface. © 2007, Elsevier Ltd.
Gov't Doc #: 1111
ISSN: 0039-6028
Appears in Collections:Journal Articles

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