Please use this identifier to cite or link to this item: https://apo.ansto.gov.au/dspace/handle/10238/7759
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dc.contributor.authorPelliccia, D-
dc.contributor.authorAndrei, YN-
dc.contributor.authorKirby, N-
dc.contributor.authorHester, JR-
dc.date.accessioned2016-10-17T05:38:31Z-
dc.date.available2016-10-17T05:38:31Z-
dc.date.issued2014-
dc.identifier.citationPelliccia, P., Nikulin, A. Y., Kirby, N., & Hester, J. (2014). Characterisation of embedded nano-precipitates by x-ray diffraction imaging and small-angle x-ray scattering. International Journal of Nanotechnology, 11(5-8), 549-554. doi:10.1504/IJNT.2014.060576en_AU
dc.identifier.govdoc7321-
dc.identifier.issn2056-4058-
dc.identifier.urihttp://dx.doi.org/10.1504/IJNT.2014.060576en_AU
dc.identifier.urihttp://apo.ansto.gov.au/dspace/handle/10238/7759-
dc.description.abstractWe report on the characterisation of embedded Al2Cu nanoparticles in Al matrix by X-ray diffraction imaging and small-angle X-ray scattering. We employed direct retrieval of the average morphological characteristics of the nanoparticles from their diffraction pattern. Data suggest the possibility of acquiring truly 3D information with X-ray diffraction imaging. Validation of the results obtained with small-angle X-ray scattering is reported. © 2020 Inderscience Enterprises Ltd.en_AU
dc.language.isoenen_AU
dc.publisherInderScience Publishersen_AU
dc.subjectX-ray diffractionen_AU
dc.subjectDataen_AU
dc.subjectMorphologyen_AU
dc.subjectValidationen_AU
dc.subjectScatteringen_AU
dc.subjectParticlesen_AU
dc.titleCharacterisation of embedded nano-precipitates by x-ray diffraction imaging and small-angle x-ray scatteringen_AU
dc.typeJournal Articleen_AU
dc.date.statistics2016-10-17-
Appears in Collections:Journal Articles

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