Please use this identifier to cite or link to this item: https://apo.ansto.gov.au/dspace/handle/10238/7071
Title: Intrinsic reduction of the ordered 4f magnetic moments in semiconducting rare-earth nitride thin films: DyN, ErN, and HoN
Authors: Cortie, DL
Brown, JD
Brück, S
Saerbeck, T
Evans, JP
Fritzsche, H
Wang, XL
Downes, JE
Klose, F
Keywords: Neutron reflectors
Nitrates
Ferromagnetism
Ions
X-ray detection
Spin
Issue Date: 26-Feb-2014
Publisher: American Physical Society
Citation: Cortie, D. L., Brown, J. D., Brück, S., Saerbeck, T., Evans, J. P., Fritzsche, H., Wang, X. L., Downes, J. E., & Klose, F. (2014). Intrinsic reduction of the ordered 4f magnetic moments in semiconducting rare-earth nitride thin films: DyN, ErN, and HoN. Physical Review B, 89(6), 064424. doi:10.1103/PhysRevB.89.064424
Abstract: Polarized neutron reflectometry and x-ray reflectometry were used to determine the nanoscale magnetic and chemical depth profiles of the heavy rare-earth nitrides HoN, ErN, and DyN in the form of 15- to 40-nm-thick films. The net ferromagnetic components are much lower than the predictions of density-functional theory and Hund's rules for a simple ferromagnetic ground state in these 4f ionic materials, which points to the intrinsic contribution of crystal-field effects and noncollinear spin structures. The magnetic moment per rare-earth ion was determined as a function of temperature in the range 5–100 K at fields of 1–4 T. It is demonstrated that the films are stoichiometric within 1–3% and magnetically homogeneous on the nanometer scale.© 2014, American Physical Society.
Gov't Doc #: 6750
URI: http://dx.doi.org/10.1103/PhysRevB.89.064424
http://apo.ansto.gov.au/dspace/handle/10238/7071
ISSN: 2469-9950
Appears in Collections:Journal Articles

Files in This Item:
There are no files associated with this item.


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.