Please use this identifier to cite or link to this item:
Title: High pressure single-crystal micro X-ray diffraction analysis with GSE_ADA/RSV software
Authors: Dera, P
Zhuravlev, K
Prakapenka, V
Rivers, ML
Finkelstein, GJ
Grubor-Urosevic, O
Tschauner, O
Clarke, SM
Downs, RT
Keywords: X-ray diffraction
Advanced photon source
Issue Date: 17-Jun-2013
Publisher: Taylor & Francis Ltd.
Citation: Dera, P., Zhuravlev, K., Prakapenka, V., Rivers, M. L., Finkelstein, G. J., Grubor-Urosevic, O., Tschauner, O., Clarke, S. M., & Downs, R. T. (2013). High pressure single-crystal micro X-ray diffraction analysis with GSE_ADA/RSV software. High Pressure Research, 33(3), 466-484. doi:10.1080/08957959.2013.806504
Abstract: GSE_ADA/RSV is a free software package for custom analysis of single-crystal micro X-ray diffraction (SCμXRD) data, developed with particular emphasis on data from samples enclosed in diamond anvil cells and subject to high pressure conditions. The package has been in extensive use at the high pressure beamlines of Advanced Photon Source (APS), Argonne National Laboratory and Advanced Light Source (ALS), Lawrence Berkeley National Laboratory. The software is optimized for processing of wide-rotation images and includes a variety of peak intensity corrections and peak filtering features, which are custom-designed to make processing of high pressure SCμXRD easier and more reliable. © 2013, Taylor & Francis.
Gov't Doc #: 6094
ISSN: 0895-7959
Appears in Collections:Journal Articles

Files in This Item:
There are no files associated with this item.

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.