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|Title:||Electron backscatter diffraction characterization of plasma immersion ion implantation effects in stainless steel|
|Keywords:||Scannning electron microscopy|
|Citation:||Davis, J., Short, K., Wuhrer, R., Phillips, M. R., Lumpkin, G. R., & Whittle, K. R. (2013). Electron backscatter diffraction characterization of plasma immersion ion implantation effects in stainless steel. Nuclear Instruments & Methods in Physics Research Section B-Beam Interactions with Materials and Atoms, 295, 38-41. doi:10.1016/j.nimb.2012.10.007|
|Abstract:||In these experiments plasma immersion ion implantation is utilised to simulate some of the radiation effects in a nuclear reactor environment. Scanning electron microscopy using the angular selective backscatter detector has revealed observable changes in crystallographic contrast after irradiation with helium ions. Further studies using electron backscatter diffraction in both plan and cross section view allow us to visualize the extent and depth of damage and observe differences in the behavior of different crystalline phases present in several grades of stainless steel. © 2012, Elsevier B.V.|
|Gov't Doc #:||6089|
|Appears in Collections:||Journal Articles|
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