Please use this identifier to cite or link to this item: https://apo.ansto.gov.au/dspace/handle/10238/5498
Title: Correlating uncompensated antiferromagnetic moments and exchange coupling interactions in interface ion-beam bombarded Co90Fe10/CoFe-oxide bilayers
Authors: Shueh, C
Chen, PS
Cortie, DL
Klose, F
Chen, WC
Wu, TH
van Lierop, J
Lin, KW
Keywords: Ion beams
Electron microscopy
Antiferromagnetism
Ferromagnestism
Morphology
Argon
Issue Date: 1-Nov-2012
Publisher: IOP Publishing LTD
Citation: Shueh, C., Chen, P. S., Cortie, D., Klose, F., Chen, W. C., Wu, T. H., van Lierop, J., & Lin, K. W. (2012). Correlating uncompensated antiferromagnetic moments and exchange coupling interactions in interface ion-beam bombarded Co90Fe10/CoFe-oxide bilayers [Special Issue]. Japanese Journal of Applied Physics, 51(11, part 2), Article Number 11PG02. doi:10.1143/JJAP.51.11PG02
Abstract: The coercivity and exchange bias field of ferro-/antiferromagnetic Co(90)Fe(10)/CoFe-oxide bilayers were studied as function of the surface morphology of the bottom CoFe-oxide layer. The CoFe-oxide surface structure was varied systematically by low energy (0-70 V) Argon ion-beam bombardment before subsequent deposition of the Co(90)Fe(10) layer. Transmission electron microscopy results showed that the bilayer consisted of hcp Co(90)Fe(10) and rock-salt CoFe-oxide. At low temperatures, enhanced coercivities and exchange bias fields with increasing ion-beam bombardment energy were observed, which are attributed to defects and uncompensated moments created near the CoFe-oxide surface in increasing amounts with larger ion-beam bombardment energies. Magnetometry results also showed an increasing divergence of the low field temperature dependent magnetization [Delta M(T)] between field-cooling and zero-field-cooling processes, and an increasing blocking temperature with increasing ion-beam bombardment energy. © 2012 IOP Publishing LTD.
Gov't Doc #: 4756
URI: http://dx.doi.org/10.1143/JJAP.51.11PG02
http://apo.ansto.gov.au/dspace/handle/10238/5498
ISSN: 0021-4922
Appears in Collections:Journal Articles

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