Please use this identifier to cite or link to this item: https://apo.ansto.gov.au/dspace/handle/10238/4896
Title: Low energy photoelectron diffraction analysis at high angular resolution of Cu and Mn/Cu surfaces
Authors: Cousland, GP
Smith, AE
Riley, JD
Stampfl, APJ
Keywords: Copper
Manganese
Diffraction
Simulation
Electrons
Kinetic energy
Photoelectron spectroscopy
Issue Date: 1-Nov-2009
Publisher: American Institute of Physics
Citation: Cousland, G. P., Smith, A. E., Riley, J. D., & Stampfl, A. P. (2009). Low energy photoelectron diffraction analysis at high angular resolution of Cu and Mn/Cu surfaces. Journal of Applied Physics, 106 (9), Article Number 093510. doi:10.1063/1.3253329
Abstract: X-ray photoelectron diffraction simulations using a real-space approach are Shown to accurately produce the extraordinarily detailed photoelectron diffraction pattern from Cu{111} at an electron kinetic energy of 523.5 eV. These same simulations show that most sensitivity is obtained when using low energy electrons at high angular resolution Structural differences are observed to be greatest around a kinetic energy of similar to 100 eV and many of the features observed in the photoelectron diffraction patterns may be directly related to phenomena observed in low energy electron diffraction patterns from the same Surface. For Cu{100}. simulations of buckled surfaces with a Mn overlayer predict that low energy photoelectron diffraction can easily discriminate chemical and structural differences. Even the effects of the relaxed Surface of Cu{100} is indeed observable along azimuthal scans around a kinetic energy of 100 eV Our results show that low energy photoelectron diffraction is extremely sensitive to changes in Surface Structure If high resolution patterns are acquired. © 2009, American Institute of Physics.
Gov't Doc #: 5127
URI: http://dx.doi.org/10.1063/1.3253329
http://apo.ansto.gov.au/dspace/handle/10238/4896
ISSN: 0021-8979
Appears in Collections:Journal Articles

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