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dc.contributor.authorDuerden, Pen_AU
dc.contributor.authorCohen, DDen_AU
dc.contributor.authorClayton, Een_AU
dc.identifier.citationDuerden, P., Cohen, D., & Clayton, E. (1979). The application of proton induced x-ray emission to the element analysis of thick obsidian samples (AAEC/E475). Lucas Heights, NSW: Research Establishment, Australian Atomic Energy Commission.-
dc.description.abstractThe proton induced x-ray emission (PIXE) technique has been applied to the analysis of element concentrations in obsidian source samples. No target preparation other than washing and the selection of a flat surface was undertaken. Thick target yields have been calculated and element concentrations derived from the detected X-ray spectra; concentrations are given for K, Ca, Ti, V, Mn, Fe, Ga, As, Rb, Sr, Y, Zr, Nb, Ta, and Pb. A pinhole filter is described which enables a single measurement of about 5 minutes duration to give element concentration data over an x-ray energy range 3-20 keV.en_AU
dc.publisherAustralian Atomic Energy Commissionen_AU
dc.subjectX-ray emission analysis-
dc.subjectEmission spectroscopy-
dc.subjectNeutron activation analysis-
dc.titleApplication of proton induced x-ray emission to the element analysis of thick obsidian samplesen_AU
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