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Title: | Determination of the residual stress field around scratches using synchrotron x-rays and nanoindentation. |
Authors: | Khan, MK Fitzpatrick, ME Edwards, L Hainsworth, SV |
Keywords: | Residual stresses Damage X-ray diffraction Crack propagation Fatigue Synchrotrons |
Issue Date: | 10-Nov-2009 |
Publisher: | Trans Tech Publications |
Citation: | Khan, M. K., Fitzpatrick, M. E., Edwards, L. E., & Hainsworth, S. V. (2009). Determination of the residual stress field around scratches using synchrotron x-rays and nanoindentation. Materials Science Forum 652 (May 2010): 25–30. doi:10.4028/www.scientific.net/msf.652.25 |
Abstract: | The residual strain field around the scratches of 125µm depth and 5µm root radius have been measured from the Synchrotron X-ray diffraction. Scratches were produced using different tools in fine-grained aluminium alloy AA 5091. Residual stresses up to +1700 micro-strains were measured at the scratch tip for one tool but remained up to only +1000 micro-strains for the other tool scratch. The load-displacement curves obtained from nanoindentation were used to determine the residual stresses around the scratches. It was found that the load-displacement curves are sensitive to any local residual stress field present and behave according to the type of residual stresses. This combination of nanoindentation and synchrotron X-rays has been proved highly effective for the study of small-scale residual stresses around the features such as scratches. © 2020 by Trans Tech Publications Ltd. |
Gov't Doc #: | 2545 |
URI: | http://dx.doi.org/10.4028/www.scientific.net/MSF.652.25 http://apo.ansto.gov.au/dspace/handle/10238/2365 |
ISBN: | 0878492585 |
ISSN: | 0255-5476 |
Appears in Collections: | Conference Publications |
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