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Title: Localisation of trace metals in metal-accumulating plants using μ-PIXE
Authors: Siegele, R
Kachenko, AG
Bhatia, NP
Wang, YD
Ionescu, M
Singh, B
Baker, AJM
Cohen, DD
Keywords: PIXE analysis
Plant tissues
Issue Date: Mar-2008
Publisher: Wiley-Blackwell
Citation: Siegele, R., Kachenko, A. G., Bhatia, N. P., Wang, Y. D., Ionescu, M., Singh, B., Baker, A. J. M., & Cohen, D. D. (2008). Localisation of trace metals in metal-accumulating plants using μ-PIXE. X-Ray Spectrometry, 37(2), 133-136. doi:10.1002/xrs.1035
Abstract: Particle induced x-ray emission (PIXE) is a very sensitive technique that can quickly and reliably measure a wide range of elements simultaneously with high sensitivity. Using a focused microbeam, elemental distributions can be mapped with high spatial resolution. We demonstrate high-resolution mapping of metals in plant leaves at 5 mu m resolution and its application in detecting sites of metal accumulation in metal-accumulating plant tissues. The importance of biological sample preparation is discussed by direct comparison of freeze-substitution and freeze-drying techniques routinely used in biological sciences. The advantages and limitations of quantitative elemental imaging using these techniques are also discussed. © 2008, Wiley-Blackwell.
Gov't Doc #: 1153
ISSN: 0049-8246
Appears in Collections:Journal Articles

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