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dc.contributor.authorSiegele, Ren_AU
dc.contributor.authorKachenko, AGen_AU
dc.contributor.authorBhatia, NPen_AU
dc.contributor.authorWang, YDen_AU
dc.contributor.authorIonescu, Men_AU
dc.contributor.authorSingh, Ben_AU
dc.contributor.authorBaker, AJMen_AU
dc.contributor.authorCohen, DDen_AU
dc.identifier.citationSiegele, R., Kachenko, A. G., Bhatia, N. P., Wang, Y. D., Ionescu, M., Singh, B., Baker, A. J. M., & Cohen, D. D. (2008). Localisation of trace metals in metal-accumulating plants using μ-PIXE. X-Ray Spectrometry, 37(2), 133-136. doi:10.1002/xrs.1035en_AU
dc.description.abstractParticle induced x-ray emission (PIXE) is a very sensitive technique that can quickly and reliably measure a wide range of elements simultaneously with high sensitivity. Using a focused microbeam, elemental distributions can be mapped with high spatial resolution. We demonstrate high-resolution mapping of metals in plant leaves at 5 mu m resolution and its application in detecting sites of metal accumulation in metal-accumulating plant tissues. The importance of biological sample preparation is discussed by direct comparison of freeze-substitution and freeze-drying techniques routinely used in biological sciences. The advantages and limitations of quantitative elemental imaging using these techniques are also discussed. © 2008, Wiley-Blackwell.en_AU
dc.subjectPIXE analysisen_AU
dc.subjectPlant tissuesen_AU
dc.titleLocalisation of trace metals in metal-accumulating plants using μ-PIXEen_AU
dc.typeJournal Articleen_AU
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