Please use this identifier to cite or link to this item: https://apo.ansto.gov.au/dspace/handle/10238/13558
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dc.contributor.authorJames, M-
dc.contributor.authorBrûlé, A-
dc.date.accessioned2022-08-16T02:20:53Z-
dc.date.available2022-08-16T02:20:53Z-
dc.date.issued2005-11-27-
dc.identifier.citationJames, M., & Brule, A. (2005). PLATYPUS - a time-of-flight neutron reflectometer at the OPAL Facility. Paper presented at the Eighth International Conference on Neutron Scattering, ICNS 2005: "Neutrons for structure and dynamics - a new era", Sydney Convention & Exhibition Centre, Sydney, Australia, 27 November-2 December 2005. In Final Programme and Abstract Book, (p. 175).en_US
dc.identifier.urihttps://apo.ansto.gov.au/dspace/handle/10238/13558-
dc.descriptionPhysical copy held by ANSTO Library at DDC 539.7217/2en_US
dc.description.abstractNeutron reflectometry is used to probe the structure of surfaces, thin-films or buried interfaces as well as processes occurring at surfaces and interfaces. Applications cover adsorbed surfactant layers, self-assembled monolayers, biological membranes, electrochemical and catalytic interfaces, polymer coatings and photosensitive films. The PLATYPUS neutron reflectometer has been recognised as one of the highest priority instruments to be constructed at the new 20MW OPAL research reactor at Lucas Heights. The instrument will be capable of collecting data from solid, liquid and magnetic samples using a broad wavelength band of polarised or non-polarised neutrons. Details of the design and construction of the PLATYPUS reflectometer will be given. © 2005 The Authorsen_US
dc.language.isoenen_US
dc.publisherThe Bragg Institute, Australian Nuclear Science and Technology Organisationen_US
dc.subjectANSTOen_US
dc.subjectFilmsen_US
dc.subjectNucleon beamsen_US
dc.subjectParticle beamsen_US
dc.subjectSensitivityen_US
dc.subjectOPAL Reactoren_US
dc.subjectNeutron reflectorsen_US
dc.subjectSurfactantsen_US
dc.titlePLATYPUS - a time-of-flight neutron reflectometer at the OPAL Facilityen_US
dc.typeConference Abstracten_US
dc.date.statistics2022-05-13-
Appears in Collections:Conference Publications

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