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|Title:||Temperature-dependent EXAFS analysis of embedded Pt nanocrystals.|
|Publisher:||Institute of Physics|
|Citation:||Giulian, R., Araujo, L. L., Kluth, P., Sprouster, D. J., Schnohr, C. S., Foran, G. J., & Ridgway, M. C. (2009). Temperature-dependent EXAFS analysis of embedded Pt nanocrystals. Journal of Physics-Condensed Matter, 21(15), 6. doi:10.1088/0953-8984/21/15/155302|
|Abstract:||The vibrational and thermal properties of embedded Pt nanocrystals (NCs) have been investigated with temperature-dependent extended x-ray absorption fine structure (EXAFS) spectroscopy. NCs of diameter 1.8-7.4 nm produced by ion implantation in amorphous SiO2 were analysed over the temperature range 20-295 K. An increase in Einstein temperature (similar to 194 K) relative to that of a Pt standard (similar to 179 K) was evident for the smallest NCs while those larger than similar to 2.0 nm exhibited values comparable to bulk material. Similarly, the thermal expansion of interatomic distances was lowest for small NCs. While the amorphous SiO2 matrix restricted the thermal expansion of interatomic distances, it did not have a significant influence on the mean vibrational frequency of embedded Pt NCs. Instead, the latter was governed by finite-size effects or, specifically, capillary pressure. © 2009, Institute of Physics|
|Gov't Doc #:||1277|
|Appears in Collections:||Journal Articles|
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