Browsing by Author Ionescu, M

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Issue DateTitleAuthor(s)
1-Aug-2017The new confocal heavy ion microprobe beamline at ANSTO: the first microprobe resolution tests and applications for elemental imaging and analysisPastuovic, Z; Siegele, R; Cohen, DD; Mann, M; Ionescu, M; Button, D; Long, S
15-Jul-2013Oxidation of polyethylene implanted with low energy magnesium ionsDeslandes, A; Ionescu, M; Karatchevtseva, I; Siegele, R; Cohen, DD
11-Feb-2008Oxygen incorporation in Ti2AlC thin films.Rosen, J; Persson, POA; Ionescu, M; Kondyurin, A; McKenzie, DR; Bilek, MMM
10-Jun-2017Photocatalytic properties of Ta-doped TiO2Alim, MA; Bak, T; Atanacio, AJ; Ionescu, M; Kennedy, BJ; Price, WS; Du Plessis, J; Pourmahdavi, M; Zhou, MF; Torres, AM; Nowotny, J
1-Jan-2014Photosensitive oxide semiconductors for solar hydrogen fuel and water disinfectionNowotny, J; Atanacio, AJ; Bak, T; Belova, S; Fiechter, S; Ikuma, Y; Ionescu, M; Kennedy, BJ; Majewski, PJ; Murch, GE; Wachsman, ED
1-Jun-2015Physics at the Australian Nuclear Science and Technology OrganisationRobinson, RA; Ionescu, M; Reinhard, MI
Apr-2015Radiation effects on microstructure and hardness of a titanium aluminide alloy irradiated by helium ions at room and elevated temperaturesWei, T; Zhu, H; Ionescu, M; Dayal, P; Davis, J; Carr, DG; Harrison, RP; Edwards, L
Nov-2016Relationship between damage and hardness profiles in ion irradiated SS316 using nanoindentation–Experiments and modelling.Saleh, M; Zaidi, Z; Hurt, C; Ionescu, M; Short, K; Daniels, JE; Bhattacharyya, D; Munroe, P; Edwards, L
1-Feb-2016Retention and damage in 3C-β SiC irradiated with He and H ionsDeslandes, A; Guenette, MC; Thomsen, L; Ionescu, M; Karatchevtseva, I; Lumpkin, GR
1-Feb-2016Retention and damage in 3C-β SiC irradiated with He and H ions.Deslandes, A; Guenette, MC; Thomsen, L; Ionescu, M; Karatchevtseva, I; Lumpkin, GR
6-Oct-2016Segregation in titanium dioxide co-doped with indium and niobiumAtanacio, AJ; Alim, MA; Ionescu, M; Nowotny, J
1-Mar-2014Segregation-induced low-dimensional surface structures in oxide semiconductorsAtanacio, AJ; Bak, T; Chu, D; Ionescu, M; Nowotny, J
Mar-2008Silicon detector dead layer thickness estimates using proton bremsstrahlung from low atomic number targets.Cohen, DD; Stelcer, E; Siegele, R; Ionescu, M
1-Jul-2014Simulation of light C4+ ion irradiation and its enhancement to the critical current density in BaFe1.9Ni0.1As2 single crystalsShahbazi, M; Wang, XL; Ionescu, M; Ghorbani, SR; Dou, SX; Choi, KY
15-Mar-2016SIRIUS - A new 6MV accelerator system for IBA and AMS at ANSTOPastuovic, Z; Button, D; Cohen, DD; Fink, D; Garton, D; Hotchkis, MAC; Ionescu, M; Long, S; Levchenko, VA; Mann, M; Siegele, R; Smith, AM; Wilcken, KM
Mar-2008Source selectivity: an assessment of volcanic glass sources in the southern Primorye region, Far East Russia.Doelman, T; Torrence, R; Popov, V; Ionescu, M; Kluyev, N; Sleptsov, I; Pantyukhina, I; White, P; Clements, M
Mar-2010Structural and morphological modification of PDMS thick film surfaces by ion implantation with the formation of strain-induced buckling domains.Winton, BR; Ionescu, M; Dou, SX; Wexler, D; Alvarez, GA
13-Jan-2012Structural Characterization of Olivine Li (Mg0.5Ni0.5) PO4 by TEMMinakshi, M; Singh, P; Ralph, D; Appadoo, D; Blackford, MG; Ionescu, M
Jun-2007Study of oxygen incorporation in PLD MgB2 films by Rutherford backscattering spectroscopy.Zhao, Y; Ionescu, M; Dou, SX; Liu, HK
May-2014Surface modifications of TiO2 by ion implantationIonescu, M; Atanacio, AJ; Davies, J; Nowotny, J; Gregg, DJ; Vance, ER; Bak, T