Browsing by Author "Sier, D"

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    High-accuracy determination of photoelectric cross sections, X-ray absorption fine structure and nanostructure analysis of zinc selenide using the X-ray extended range technique
    (International Union of Crystallography, 2021-08-14) Sier, D; Cousland, GP; Trevorah, RM; Ekanayake, RSK; Tran, CQ; Hester, JR; Chantler, CT
    Measurements of mass attenuation coefficients and X-ray absorption fine structure (XAFS) of zinc selenide (ZnSe) are reported to accuracies typically better than 0.13%. The high accuracy of the results presented here is due to our successful implementation of the X-ray Extended Range Technique (XERT), a relatively new methodology, which can be set up on most synchrotron X-ray beamlines. 561 attenuation coefficients were recorded in the energy range of 6.8 keV to 15 keV that was independently calibrated using powder diffractometry, with measurements concentrated at the zinc and selenium pre-edge, near edge and fine structure absorption edge regions. The removal of systematic effects as well as coherent (Thermal Diffuse) and incoherent (Compton) scattering processes produced very high accuracy values of photoelectrc attenuation which in turn yielded a detailed nanostructural analysis of room temperature ZnSe with full uncertainty propagation. Bond lengths, accurate to 0.003 Å to 0.009 Å, or 0.1% to 0.3%, are plausible and physical. Small variation from a crystalline structure suggests local dynamic motion beyond that of a standard crystal lattice, noting that XAFS is sensitive to dynamic correlated motion. The results obtained in this work are the most accurate to date with comparisons to theoretically determined values of the attenuation showing discrepancies from literature theory of up to 4%, motivating further investigation into the origin of such discrepancies. © The Authors
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    High-accuracy transmission and fluorescence XAFS of zinc at 10 K, 50 K, 100 K and 150 K using the hybrid technique
    (International Union of Crystallography, 2022-10-24) John, MW; Sier, D; Ekanayake, RSK; Schalken, MJ; Tran, CQ; Johannessen, B; de Jonge, MD; Kappen, P; Chantler, CT
    The most accurate measurements of the mass attenuation coefficient for metals at low temperature for the zinc K-edge from 9.5 keV to 11.5 keV at temperatures of 10 K, 50 K, 100 K and 150 K using the hybrid technique are reported. This is the first time transition metal X-ray absorption fine structure (XAFS) has been studied using the hybrid technique and at low temperatures. This is also the first hybrid-like experiment at the Australian Synchrotron. The measured transmission and fluorescence XAFS spectra are compared and benchmarked against each other with detailed systematic analyses. A recent method for modelling self-absorption in fluorescence has been adapted and applied to a solid sample. The XAFS spectra are analysed using eFEFFIT to provide a robust measurement of the evolution of nanostructure, including such properties as net thermal expansion and mean-square relative displacement. This work investigates crystal dynamics, nanostructural evolution and the results of using the Debye and Einstein models to determine atomic positions. Accuracies achieved, when compared with the literature, exceed those achieved by both relative and differential XAFS, and represent a state-of-the-art for future structural investigations. Bond length uncertainties are of the order of 20–40 fm. © Open Access - CC BY 4.0 licence