Browsing by Author "Phillips, NW"

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    High speed free-run ptychography at the Australian Synchrotron
    (Australian Nuclear Science and Technology Organisation, 2021-11-26) Kewish, CM; Jones, MWM; van Rissen, GA; Phillips, NW; Hinsley, GN; Schrank, CE; Afshar, J; Reinhardt, J; de Jonge, MA
    The Australian Synchrotron X-ray Fluorescence Microscopy (XFM) beamline has recently implemented fast scanning ptychography, a scanning X-ray diffraction microscopy method. Ptychography creates super-resolution images from transmitted microdiffraction patterns acquired as the sample is scanned through the beam. Highspeed detectors and high-performance computers are required to iteratively reconstruct these complex images. The experimental methods and reconstruction algorithms have significantly evolved over the last decade and a half into a mature and user-friendly complementary imaging method to XFM. Here we present the implementation of high speed ptychography at the XFM beamline, which includes a free run data collection mode where detector dead time is eliminated, and the scan time is optimized. We show that free-run data collection is viable for fast and high-quality ptychography by demonstrating extremely high data rate acquisition covering areas up to 352,000 μm2 at up to 140 μm2/s, with 18× spatial resolution enhancement compared to the beam size. With these improvements, ptychography at velocities up to 250 μm/s is approaching speeds compatible with fast-scanning X-ray fluorescence microscopy. The combination of these methods provides morphological context for elemental and chemical information, enabling unique scientific outcomes. © The Authors
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    High-speed free-run ptychography at the Australian Synchrotron
    (International Union of Crystallography, 2022-03) Jones, MWM; van Riessen, GA; Phillips, NW; Schrank, CE; Hinsley, GN; Afshar, N; Reinhardt, J; de Jonge, MD; Kewish, CM
    Over the last decade ptychography has progressed rapidly from a specialist ultramicroscopy technique into a mature method accessible to non-expert users. However, to improve scientific value ptychography data must reconstruct reliably, with high image quality and at no cost to other correlative methods. Presented here is the implementation of high-speed ptychography used at the Australian Synchrotron on the XFM beamline, which includes a free-run data collection mode where dead time is eliminated and the scan time is optimized. It is shown that free-run data collection is viable for fast and high-quality ptychography by demonstrating extremely high data rate acquisition covering areas up to 352 000 μm2 at up to 140 μm2 s-1, with 13x spatial resolution enhancement compared with the beam size. With these improvements, ptychography at velocities up to 250 μm s-1 is approaching speeds compatible with fast-scanning X-ray fluorescence microscopy. The combination of these methods provides morphological context for elemental and chemical information, enabling unique scientific outcomes. © The Authors - Open Access CC-By Licence
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    In situ applications of soft x-ray ptychography
    (Australian Microscopy and Microanalysis Society, 2016-02-04) van Riessen, GA; James, M; van Riessen, A; Phillips, NW; de Jonge, MD; Kourousias, G; Giamoncelli, A; Bozzini, B
    Coherent diffractive imaging (CDI) with synchrotron X-ray beams allows extended objects to be characterised at high spatial resolution (<30 nm) and high energy resolution (0.1 eV). In an implementation of CDI known as ptychography, a far-field diffraction pattern is measured from many overlapping regions as the sample is scanned through a coherent X-ray beam. Quantitative images of an object are then obtained from the far-field intensity pattern through iterative reconstruction algorithms. This provides a unique method of studying the elemental and chemical-state distributions in relatively thick materials and their relationship to nanoscale morphology. The high coherent flux offered by synchrotron X-ray sources can also potentially allow high temporal resolution through the use of emerging detector technology and advanced image reconstruction algorithms. This in turn allows the nanoscale structure of functional materials to be studied under non-equilibrium real-time conditions. In this work, we review recent efforts to apply soft X-ray ptychography to in situ and operando applications at several synchrotron facilities. We emphasise studies of functional materials that are characterised by heterogeneity over a range of relevant length scales, including energy storage materials based on polypyrrole nanocomposites and inorganic, aluminosilicate based ceramics. Finally, a perspective on the future prospects of the method will be given, with particular attention to how experimental challenges can be overcome to achieve the spatiotemporal resolution limits defined by the available coherent flux from synchrotron light sources.
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    Simultaneously localising biometals within the high resolution ultrastructure of whole C. elegans
    (Australian Microscopy and Microanalysis Society, 2016-02-04) Jones, MWM; McColl, G; van Riessen, GA; Phillips, NW; Vine, D; Abbey, B; de Jonge, MD
    Ptychography is a coherent diffraction imaging method where multiple overlapping diffraction frames are combined, providing high resolution images of the electron density of extended objects. Recently, X-ray ptychography has seen many efficiency improvements that allow large areas to be imaged rapidly, making simultaneous X-ray ptychography and fluorescence microscopy experimentally viable. Here we use simultaneous X-ray fluorescence microscopy and ptychography to image entire C. elegans, with sub-micron and sub 100 nm elemental and ultrastructure resolutions respectively. Rapid data collection allowed the entire 1 mm long animal to be imaged in only a few hours. With the information from both techniques, the elemental maps can be viewed in the context of the high resolution ultrastructure, allowing further insights into the localisation of the fluorescent signal.