Browsing by Author "Muster, TH"

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    Using x-ray tomography, PALS and Raman spectroscopy for characterization of inhibitors in epoxy coatings
    (Elsevier, 2012-08) Hughes, AE; Mayo, SC; Yang, YS; Markley, T; Smith, SV; Sellaiyan, S; Uedono, A; Hardin, SG; Muster, TH
    Model paint materials were generated by adding a range of inorganic materials into an epoxy. The inorganic materials included inhibitors (Zn3(PO4)2 and SrCrO4) and a filler (rutile TiO2).The SrCrO4 system was characterized using SEM, TEM, PALS and Raman spectroscopy and found to have an even distribution of inhibitor in the polymer matrix. X-ray tomography was performed on the mixed SrCrO4/TiO2 and Zn3(PO4)2/TiO2 systems. A new technique called data constrained modelling was combined with the tomographic technique to produce a 3D distribution of the inorganic phases within the polymer matrix. © 2011 Elsevier B.V.