Browsing by Author "Meier, M"

Now showing 1 - 1 of 1
  • No Thumbnail Available
    Item
    Characterisation and application of a SPLEED-based spin polarisation analyser
    (Elsevier, 2007-12-15) Yu, DH; Math, C; Meier, M; Escher, M; Rangelov, G; Donath, M
    A commercial electron spin analyser, based on spin-polarised low-energy electron diffraction (SPLEED) from W(100), has been characterised with incident polarised electron beams from a standard GaAs polarised electron source. The dependence of the Sherman function on the scattering energy and elapse time after CO-flash of the tungsten crystal of the analyser have been measured. The influence of the stray magnetic field on the performance of the analyser has been investigated. The spin analyser has been applied in monitoring the reorientation transition of the easy magnetisation direction of Fe films on W(110) upon the exposure of CO adsorbent on the surface. © 2007, Elsevier Ltd.