Browsing by Author "Kench, PL"

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    An investigation of inconsistent projections and artefacts in multi-pinhole SPECT with axially aligned pinholes
    (IOP Publishing Ltd, 2011-12-07) Kench, PL; Lin, J; Grégoire, MC; Meikle, SR
    Multiple pinholes are advantageous for maximizing the use of the available field of view (FOV) of compact small animal single photon emission computed tomography (SPECT) detectors. However, when the pinholes are aligned axially to optimize imaging of extended objects, such as rodents, multiplexing of the pinhole projections can give rise to inconsistent datawhich leads to ‘ghost point’ artefacts in the reconstructed volume. A novel four pinhole collimator with a baffle was designed and implemented to eliminate these inconsistent projections. Simulation and physical phantom studies were performed to investigate artefacts from axially aligned pinholes and the efficacy of the baffle in removing inconsistent data and, thus, reducing reconstruction artefacts. SPECT was performed using a Defrise phantom to investigate the impact of collimator design on FOV utilization and axial blurring effects. Multiple pinhole SPECT acquired with a baffle had fewer artefacts and improved quantitative accuracy when compared to SPECT acquired without a baffle. The use of four pinholes positioned in a square maximized the available FOV, increased acquisition sensitivity and reduced axial blurring effects. These findings support the use of a baffle to eliminate inconsistent projection data arising from axially aligned pinholes and improve small animal SPECT reconstructions. © 2011 IOP Publishing LTD
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    Projection process modelling for iterative reconstruction of Pinhole SPECT
    (IEEE, 2010-10-01) Lin, J; Kench, PL; Grégoire, MC; Meikle, SR
    In iterative reconstruction of pinhole SPECT data, the forward and back projection processes are often performed using the ray tracing method. Ray tracing is computationally efficient, but it has the drawback of poor reconstruction quality due to the missing voxel effect and textural artefacts. In this paper, the pinhole projection process was modelled starting from consideration of all the main factors affecting pinhole projection, such as voxel shape, penetration of the pinhole edges and detector response. Next, approximations were made to reduce the computational speed and the effect of the approximations on reconstructed image accuracy was evaluated in simulation and phantom experiments and compared with the ray tracing algorithm. When used in conjunction with the ML-EM algorithm, the proposed model improved reconstructed image accuracy compared with the ray tracing method and achieved comparable computational efficiency. Therefore, the proposed projection model is a practical alternative to the ray tracing algorithm for pinhole SPECT reconstruction.© 2010, Institute of Electrical and Electronics Engineers (IEEE)