Browsing by Author "Dytlewski, N"
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- ItemAnalysis of compound semiconductor materials using heavy ion recoil spectrometry(Australian and New Zealand Institutes of Physics, 1994-11-09) Walker, SR; Johnston, PN; Bubb, IF; Studd, W; Cohen, DD; Dytlewski, N; Hult, M; Whitlow, HJ; Zahring, C; Östling, M; Andersson, M; Martin, JWHeavy Ion Recoil Spectrometry has been used to examine various semiconductor material systems which cannot easily be studied using convensional ion beam techniques such as RBS. The technique enables the determination of seperate energy spectra for individual elements. This enables it to be used in many situations where RBS is inappropriate due to the superimposition of signals in the backscattering spectrum. We have employed Recoil Spectrometry to study; light element impurity concentrations, stoiciometry and metalisation contact systems for various compound semiconductor materials.- The experiments were performed at the ANTARES (TN Tandem) accelerator facillity at Lucas Heights using 61-91 MeV 12?I ions jn e incident " ' i ions cause nuclei of the sample to recoil following Rutherford scattering. The recoiling target nuclei are then analysed by a Time Of Flight and Energy (TOF-E) detector telescope composed of two timing pickoff detectors and a surface barrier (energy) detector. From the time of flight and energy, the ion mass can be determined and individual depth distributions for each element can be obtained.
- ItemCharacterisation of single-crystal mercuric iodide(Elsevier, 2004-01-21) Alexiev, D; Dytlewski, N; Reinhard, MI; Mo, LThe mobility-lifetime product of electrons and holes in single-crystal mercuric iodide for detector applications was measured to be 4×10−5 and 3×10−5 cm2/V respectively. The charge carriers were optically induced by a near band gap excitation using a GaP (560 nm) light emitting diode. Optical Deep Level Transient Spectrometry measurements of trapping states showed three dominant energy levels at 0.26, 0.8 and 1.4 eV. There is little correlation between trapping levels reported in the literature. © 2004, Elsevier Ltd.
- ItemAn elastic recoil time of flight spectrometer for material analysis(Australian and New Zealand Institutes of Physics, 1994-02-10) Martin, JW; Cohen, DD; Dytlewski, N; Russell, GJ; Garton, DA heavy ion elastic recoil time of flight (ERTOF) spectrometer has been built on the ion beam analysis (1BA) beam line of the 8 MV tandem particle accelerator at the Australian Nuclear Science and Technology Organisation (ANSTO). The spectrometer consists of two electrostatic mirror time detectors, as described in the literature by Whitlow et. al. and Busch et al. at the forward scattering angle of 45°, and an ion-implanted surface barrier energy detector. The flight length of 750mm gives a typical timing resolution of a few hundred pico-seconds. The use of high energy heavy ions in recoil spectrometry is ideally suited to the analysis of light ions in heavy matrices, though the analysis of recoil spectra presents some ambiguity due to the overlap of individual depth profiles. An HRTOF spectrometer, with incident 77MeV 127 I 10+ as designed here, allows individual depth profiling of most elements contained within the matrix, even those in close proximity in the periodic table, therefore providing an unambiguous profile and greater certainty in sample analysis. This paper will outline the design and principles of the ERTOF spectrometer built on the IBA beam line at ANSTO. The application of this technique to materials analysis and such examples as YBCO superconductors and AlGaAs semiconductors systems will also be presented.
- ItemHigh energy, heavy ion nuclear microprobe for ion beam research on the tandem accelerator at ANSTO.(Australian Nuclear Science and Technology Organisation, 1996-04) Cohen, DD; Siegele, R; Dytlewski, NA comprehensive review is given on the production and use heavy ion beams with spot sizes of a few μm. The development of a high energy, heavy ion microprobe at ANSTO and its possible applications are discussed.
- ItemIon beam analysis techniques(Australian Institute of Physics, 1998-04-01) Dytlewski, N; Siegele, R; Cohen, DDThe international community introduced Ion Beam Analysis (IBA) in the 1950's, principally as an analytical technique for the characterisation of solid materials. Spectacular growth occurred in the subsequent three decades which was made possible by the increasing availability of Van de Graff type accelerators, and the development of semiconductor detector technologies. The demonstrated capabilities of speed, versatility sensitivity and the non-destructive nature of IBA resulted in ion beams being applied to solve problems in many diverse fields such as materials science, biology, geology, medicine and the environment. Whilst much of the low energy and light ion beam techniques are now mature, development of novel instrumentation and techniques using high energy and heavy ion beams is currently a developing field.
- ItemLeaching of Synroc in D2O(Monash University, Department of Physics, 1996-02-03) Vance, ER; Dytlewski, N; Begg, BD; Prince, KE; Thorogood, GJThe use of D2O rather than H2O for leaching Synroc and its constituent phases allows the study of hydration and hydroxylation reactions without the contaminating influence of atmospheric moisture. For Synroc leached at 190 deg C for 5-30 days, the penetration of D into the Synroc is found as ∼30 nm from both energy recoil analysis using 1.5 MeV He ions from a Van de Graaff accelerator and secondary ion mass spectroscopy near mass 18(OD-). Analogous studies have been carried out on single crystals of SrTiO3 which have the perovskite (a constituent phase of Synroc) structure, and augmented by additional atomic force and scanning electron microscope studies of secondary TiO2 alteration products. Alteration products on single crystals of CaTiO3 have also been studied.