Browsing by Author "Andrei, YN"

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    Characterisation of embedded nano-precipitates by x-ray diffraction imaging and small-angle x-ray scattering
    (InderScience Publishers, 2014) Pelliccia, D; Andrei, YN; Kirby, N; Hester, JR
    We report on the characterisation of embedded Al2Cu nanoparticles in Al matrix by X-ray diffraction imaging and small-angle X-ray scattering. We employed direct retrieval of the average morphological characteristics of the nanoparticles from their diffraction pattern. Data suggest the possibility of acquiring truly 3D information with X-ray diffraction imaging. Validation of the results obtained with small-angle X-ray scattering is reported. © 2020 Inderscience Enterprises Ltd.