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Issue DateTitleAuthor(s)
Aug-2012Using X-ray tomography, PALS and Raman spectroscopy for characterization of inhibitors in epoxy coatingsHughes, AE; Mayo, S; Yang, YS; Markley, T; Smith, SV; Sellaiyan, S; Uedono, A; Hardin, SG; Muster, TH
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