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Showing results 9 to 11 of 11

Issue Date	Title	Author(s)
Sep-2010	Temperature and composition dependent structural investigation of the defect perovskite series Sr1−xTi1−2xNb2xO3, 0≤x≤0.2.	Brant, WR; Schmid, S; Gu, Q; Withers, RL; Hester, J; Avdeev, M
11-Sep-1999	Transient conductance technique for characterisation of deep-level defects in highly irradiated detector-grade silicon.	Alexiev, D; Reinhard, MI; Mo, L; Rosenfeld, A
22-Jan-2010	Tuning the defect density in chemically synthesized graphene.	Choucair, M; Stride, JA

Showing results 9 to 11 of 11