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Browsing by Subject Rutherford Backscattering Spectroscopy

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Issue DateTitleAuthor(s)
15-Apr-1996Elemental composition of reactively sputtered indium nitride thin films.Sunil, K; Mo, L; Motlan; Tansley, TL
Jun-2008Structural characterization of Ge nanocrystals in silica amorphised by ion irradiation.Araujo, LL; Giulian, R; Johannessen, B; Llewellyn, DJ; Kluth, P; Azevedo, GD; Cookson, DJ; Ridgway, MC
Jun-2007Study of oxygen incorporation in PLD MgB2 films by Rutherford backscattering spectroscopy.Zhao, Y; Ionescu, M; Dou, SX; Liu, HK
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