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Issue Date	Title	Author(s)
15-Apr-1996	Elemental composition of reactively sputtered indium nitride thin films.	Sunil, K; Mo, L; Motlan; Tansley, TL
Jun-2008	Structural characterization of Ge nanocrystals in silica amorphised by ion irradiation.	Araujo, LL; Giulian, R; Johannessen, B; Llewellyn, DJ; Kluth, P; Azevedo, GD; Cookson, DJ; Ridgway, MC
Jun-2007	Study of oxygen incorporation in PLD MgB2 films by Rutherford backscattering spectroscopy.	Zhao, Y; Ionescu, M; Dou, SX; Liu, HK

Showing results 1 to 3 of 3