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Issue DateTitleAuthor(s)
1-May-2012Ab initio parametrized polarizable force field for rutile-type SnO2Miiller, W; Kearley, GJ; Ling, CD
12-Apr-2012Direct Measurement of van der Waals and Diffuse Double-Layer Forces between Titanium Dioxide Surfaces Produced by Atomic Layer DepositionWalsh, RB; Nelson, A; Skinner, WM; Parsons, D; Craig, VSJ
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