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Browsing by Author Raisanen, J

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Issue DateTitleAuthor(s)
1-Jan-2016Charge collection efficiency degradation induced by MeV ions in semiconductor devices: model and experimentVittone, E; Pastuovic, Z; Breese, M; Garcia Lopez, J; Jaksic, M; Raisanen, J; Siegele, R; Simon, A; Vizkelethy, G
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