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Browsing by Author Capan, I

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Issue DateTitleAuthor(s)
1-Aug-2014Generation of vacancy cluster-related defects during single MeV silicon ion implantation of silicon.Pastuovic, Z; Capan, I; Siegele, R; Jacimovic, R; Forneris, J; Cohen, D D; Vittone, E
28-Feb-2011Probability of divacancy trap production in silicon diodes exposed to focused ion beam irradiationPastuović, Z; Vittone, E; Capan, I; Jaksic, M
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