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Issue Date	Title	Author(s)
Sep-1980	Transient capacitance measurements of deep level defects introduced in y-ray compensated germanium by long-term annealing at room temperature.	Pearton, SJ; Williams, AA; Tavendale, AJ; Lawson, EM
Dec-1980	Transient conductance spectroscopy measurements of defect states in y-irradiated n-channel silicon field effect transistors with possible y-dosemeter applications.	Pearton, SJ; Tavendale, AJ; Williams, AA

Showing results 6 to 7 of 7