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Issue Date	Title	Author(s)
Jan-2009	In situ micro-Raman analysis and x-ray diffraction of nickel silicide thin films on silicon.	Bhaskaran, M; Sriram, S; Perova, TS; Ermakov, V; Thorogood, GJ; Short, KT; Holland, AS
Feb-2009	Microstructural and compositional analysis of strontium-doped lead zirconate titanate thin films on gold-coated silicon substrates.	Sriram, S; Bhaskaran, M; Mitchell, DRG; Short, KT; Holland, AS; Mitchell, A

Showing results 1 to 2 of 2