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Browsing by Author Holland, AS

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Issue DateTitleAuthor(s)
Jan-2009In situ micro-Raman analysis and x-ray diffraction of nickel silicide thin films on silicon.Bhaskaran, M; Sriram, S; Perova, TS; Ermakov, V; Thorogood, GJ; Short, KT; Holland, AS
Feb-2009Microstructural and compositional analysis of strontium-doped lead zirconate titanate thin films on gold-coated silicon substrates.Sriram, S; Bhaskaran, M; Mitchell, DRG; Short, KT; Holland, AS; Mitchell, A
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