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Issue Date	Title	Author(s)
15-Oct-2011	Focused ion beam fabrication and IBIC characterisation of a diamond detector with buried electrodes	Olivero, P; Forneris, J; Jaksic, M; Pastuovic, Z; Picollo, F; Skukan, N; Vittone, E
15-Oct-2011	Monte Carlo analysis of a lateral IBIC experiment on a 4H-SiC Schottkey diode	Olivero, P; Forneris, J; Gamarra, P; Jaksic, M; Lo Giudice, A; Manfredotti, C; Pastuovic, Z; Skukan, N; Vittone, E
28-Feb-2011	Probability of divacancy trap production in silicon diodes exposed to focused ion beam irradiation	Pastuović, Z; Vittone, E; Capan, I; Jaksic, M

Showing results 1 to 3 of 3